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Chiral-Index Resolved Length Mapping of Carbon Nanotubes in Solution Using Electric-Field Induced Differential Absorption Spectroscopy

Li, Wenshan (Karlsruhe Institute of Technology, Karlsruhe, GER); Hennrich, Frank (Karlsruhe Institute of Technology, Karlsruhe, GER); Flavel, Benjamin Scott (Karlsruhe Institute of Technology, Karlsruhe, GER); Kappes, Manfred (Karlsruhe Institute of Technology, Karlsruhe, GER); Krupke, Ralph (Karlsruhe Institute of Technology, Karlsruhe, GER)

We demonstrate a rather simple method based on electric-field induced differential absorption spectroscopy (EFIDAS) to measure the chiral-index-resolved average length of SWCNTs in dispersions [1]. The method takes advantage of the electric-field induced length-dependent dipole moment of nanotubes and has been verified and calibrated by atomic force microscopy. This method not only provides a low cost, insitu approach for length measurements of SWCNTs in dispersion, but due to the sensitivity of the method to the SWCNT chiral index, the chiral-index dependent average length of fractions obtained by chromatographic sorting can also be derived. Furthermore, we report on our recent results on fabricating transistors from highly enriched semiconducting SWCNTs prepared by PODOF polymer wrapping and sizeexclusion chromatography [2]. The purity of the material was determined to be > 99.7 % from the transfer characteristics of short-channel transistors comprising densely aligned sc-SWCNTs. The transistors possess a hole mobility of up to 297 cm2V-1s-1 and On/Off ratio as high as 2×108.

[1] Li W, Hennrich F, Flavel S, Kappes M, Krupke R, under review.

[2] Hennrich F, Li W, Fischer R, Lebedkin S, Krupke R, Kappes M, ACS Nano, 10 (2016) 1888 

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